hardLIGHT TXS
tender x-ray spectrometer
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single-shot diagnostics at 2 to 4 keV
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backscattering mode for online beam characterization
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XES mode for investigating material samples
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energy resolution of 0.3eV
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compact and mobile device
The TXS spectrometer enables accurate photon diagnostics at HHG beamlines, X-ray free-electron lasers, and table-top X-ray lasers. Photon energies between 2 keV and 4 keV can be measured in single-shot.
In von Hamos geometry with high-efficiency backscattering, the X-ray spectrum is fingerprinted for online beam characterization. The transmitted beam remains undisturbed with >90% transmission for further use in experiments.
By simply exchanging the backscattering probe with a material sample, the hardLIGHT TXS is made ready for X-ray emission spectroscopy (XES). The tender X-ray range provides sensitive access to the chemical state of many materials, e.g. investigations of sulfur at 2keV allow for important insights for battery research.
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Customized derivatives of the TXS spectrometer are also available. Contact us to discuss your application.
Downloads
hardLIGHT TXS: tender x-ray spectrometer
specifications
Results
X-ray absorption spectroscopy (XAS) at the sulfur K-edge
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(data courtesy of Dr. W. Malzer, TU Berlin)
Applications
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photon diagnostics at HHG beamlines,
X-ray free-electron lasers, table-top X-ray lasers -
in-situ XES measurements