maxION

PROTON / ION SPECTROMETERS

H+P ion spectrometers represent a major improvement over the traditional Thomson parabola. Due to their high energy resolution of >10% combined with angular resolution, they provide high-accuracy estimates for conversion efficiencies from laser into particle energy. In addition, their significantly increased acceptance angle of 30° allows for much more realistic measurements.
Spectral information is provided for each charged ion species.
Multiple parameters can be investigated simultaneously, minimizing the impact of shot-to-shot fluctuations.

measured ion traces from the ion wide-angle spectrometer iWASP

Characteristics

spectrometer for angularly resolved energy spectra for protons and other ion species
charge information on ion species

high energy resolution: >10% at 50MeV
wide acceptance angle of 30°

direct and stray light shielding
suited for low repetition rate lasers

spectral analysis software package

Special solutions

We offer specialized solutions for almost every application, including:

special housing geometries, in-chamber solutions
special mounting situations
UHV configurations

Please contact us with any special requirements you may have.

Customization

Our goal is to supply the perfect ion spectrometer for your application. We customize every spectrometer to exactly match the desired application.

This includes e.g.:

interfacing to experimental chambers
adaption to beam parameters
integration of customer-supplied detectors

Applications

laser ion acceleration
distinguish different acceleration mechanisms (Target Normal Sheath Acceleration TNSA, Radiation Pressure Acceleration RPA, Break-Out Afterburner BOA)

Detection

Our ion spectrometers are operated with state-of-the-art detectors:

high-sensitivity image plates
scintillators
MCPs

We will supply the detector that best fits your application

Care is taken to shield from direct and stray laser light and x-rays from the laser-plasma interaction.

Specifications

Please send us an email inquiry for further information, specifications, references or a quotation.