![hp01f_edited.jpg](https://static.wixstatic.com/media/318e38_3d563d25194742bc8b4e0d257dac6b12~mv2.jpg/v1/fill/w_65,h_35,al_c,q_80,usm_0.66_1.00_0.01,blur_2,enc_auto/318e38_3d563d25194742bc8b4e0d257dac6b12~mv2.jpg)
![Tender x-ray spectrometer.JPG](https://static.wixstatic.com/media/318e38_a157b875e28f4480ab45a2c20340436c~mv2.jpg/v1/crop/x_161,y_74,w_938,h_624/fill/w_478,h_318,al_c,q_80,usm_0.66_1.00_0.01,enc_auto/Tender%20x-ray%20spectrometer_JPG.jpg)
hardLIGHT TXS
tender x-ray spectrometer
-
single-shot diagnostics at 2 to 4 keV
-
backscattering mode for online beam characterization
-
XES mode for investigating material samples
-
energy resolution of 0.3eV
-
compact and mobile device
The TXS spectrometer enables accurate photon diagnostics at HHG beamlines, X-ray free-electron lasers, and table-top X-ray lasers. Photon energies between 2 keV and 4 keV can be measured in single-shot.
In von Hamos geometry with high-efficiency backscattering, the X-ray spectrum is fingerprinted for online beam characterization. The transmitted beam remains undisturbed with >90% transmission for further use in experiments.
By simply exchanging the backscattering probe with a material sample, the hardLIGHT TXS is made ready for X-ray emission spectroscopy (XES). The tender X-ray range provides sensitive access to the chemical state of many materials, e.g. investigations of sulfur at 2keV allow for important insights for battery research.
​
Customized derivatives of the TXS spectrometer are also available. Contact us to discuss your application.
Applications
-
photon diagnostics at HHG beamlines,
X-ray free-electron lasers, table-top X-ray lasers -
in-situ XES measurements