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nanoLIGHT

SPECTROMETER & BEAM PROFILER

XUV beam characterization made easy: the nanoLIGHT combines the functionalities of an XUV spectrometer and an XUV beam profiler in one unit. It is quickly integrated into experimental setups: the entire device is mounted on a standard CF200 vacuum flange. Switching between operating modes or removal from the XUV beam path is completed within seconds.

Characteristics

 

  • In-situ XUV spectrometer and beam profiler

  • Cost-effective

  • Compact footprint (16x17cm²)

  • Quick mode switching

  • Wavelength coverage 10 - 80nm, recorded simultaneously

  • Insert for thin metal spectral filters

  • Background light reduction jig

Specifications

 

For further specifications, please download the product spec sheet:

Please send us an email inquiry for further information, references or a quotation.

Detection

 

A large area MCP combined with a phosphorous screen detects the spectrum. This has the following benefits:

  • broad spectral coverage

  • high efficiency

  • large dynamic range

  • adjustable sensitivity, up to single photon counting

  • low background noise

Configurations
Applications

 

  • high harmonic generation (HHG) radiation

  • high intensity laser-matter interaction

  • undulator and free-electron-laser (FEL) radiation

  • magnetically confined plasmas

  • fusion research

  • characterization of line-emission sources