in-situ beam characterization with beam bypass
spectrometer and beamprofiler
wavelength range from 10 to 80 nm
quick and easy integration
compact and versatile device
nanoLIGHT is a full characterization instrument for periodically sampling an XUV beam in-situ. It incorporates spectrometer and beamprofiler and can be retracted fully for beam bypass. Switching between the modes of operation is fast and automated.
With its compact footprint of 16x17cm², nanoLIGHT fits in the most constricted setups and is a perfect retrofit solution.
The extremely wide wavelength range of 10-80nm can be recorded simultaneously. A filter insertion unit permits selection and calibration with metal filters. The high grating efficiency of 20% over the full range and the adjustable sensitivity of the MCP detector allow for a large dynamic range.
Customized in-chamber versions of nanoLIGHT are also available.
nanoLIGHT: integrated XUV spectrometer and beamprofiler
High-harmonic generation sources
Intense laser-matter interaction