integrated XAFS solution
lab-based turn-key EXAFS and XANES system
very high signal to noise ratio
wide bandpass of up to 1keV
hiXAS offers a complete lab-based solution for Extended X-ray Absorption Fine Structure (EXAFS) and X-ray Absorption Near Edge Structure (XANES) measurements. In a compact footprint, it integrates x-ray tube source, high-resolution spectrometer, and hybrid detector together with a software suite to control instrument functions and analyze data.
Spectra quality is on par with synchrotron measurements, so that tedious applying and waiting for beamtime is no longer necessary.
The x-ray tube source and spectrometer cover the energy range 5 to 12 keV, thus including the K absorption edges of
3d-transition metals. The optimized HAPG von Hamos architecture of the spectrometer yields an extremely high signal-to-noise ratio. As a consequence, the analyte concentration can be as low as a few weight percent. The instrument combines high efficiency with high spectral resolving power of up to E/ΔE = 4000, constant over the range of the covered absorption edges.
Range of elements accessible to hiXAS for EXAFS and XANES measurements. Even diluted samples with analyte concentrations of only a few weight percent can be measured in a time frame of several minutes.
hiXAS: turn-key laboratory EXAFS solution
HAPG von Hamos
X-ray absorption measurement of a Cu foil
Acquisition time: 3 min with sample
1.5 min without sample
C. Schlesiger et al, Recent progress in the performance of HAPG based laboratory EXAFS and XANES spectrometers
X-ray absorption spectrum of a 6um-thick Ni foil. Comparison to the spectrum obtained at a synchrotron (NSLS, resolving power E/ΔE = 5000) shows the high quality results of the table-top instrument. All relevant spectral features are present, allowing for the determination of chemical compounds.
Chemical speciation and concentration ratios
Short range order and bond length determination