easyLIGHT VUV
compact VUV spectrometer
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spectrograph and monochromator functionality
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grating with best-in-class efficiency
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wavelength range from 80 to 300 nm
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high accuracy wavelength setting
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compact and modular design
easyLIGHT VUV is an intuitive and compact spectrograph for the VUV spectral range with competitive pricing. Spectral coverage extends from 80nm to 300nm. The aberration-corrected grating provides best-in-class efficiency of up to 43%.
The combined spectrograph and monochromator functionality gives highest flexibility. Entrance and/or exit slits are continuously adjustable manually or motorized.
Detector options include
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VUV CCDs for highest resolution and dynamic range
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MCP/CMOS detectors for broadest wavelength coverage and gated / intensified detection
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photomultiplier detectors for scanning applications
Please contact us to discuss your needs.
Customized derivatives of the easyLIGHT spectrometer are also available.
Modular design
The versatile and flexible design of easyLIGHT allows for quick switching between spectrometer and monochromator modes.
Entrance and detector/exit ports can be swapped.
Three auxiliary ports are available for the installation of vacuum pumps, gauges, extra feedthroughs, etc.
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easyLIGHT VUV: compact VUV spectrometer and monochromator
specifications
The gateway to vacuum UV
application note
Results
Sulfur detection by Laser Induced Breakdown Spectroscopy (LIBS) on lunar-analog samples. The aim is to study the potential of VUV-LIBS on a mission to Mars. The results indicate improved detection capabilities for sulfur as compared to LIBS in standard spectral ranges. Limits of detection for S are estimated at 0.5at%.
S. Kubitza et al, Detecting sulfur on the Moon: The potential of vacuum ultraviolet laser-induced breakdown spectroscopy
Experimental high harmonic spectra reflected from monocrystalline silicon with linear polarization of the driving pulse along [100] (black curves) and [110] (red curves) crystallographic directions. The central photon energies of the driving pulses are 0.6 eV (wavelength of 2000 nm).
P. Suthar et al, Role of Van Hove singularities and effective mass
anisotropy in polarization-resolved high harmonic spectroscopy of silicon
Applications
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Laser-induced breakdown spectroscopy LIBS
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Plasma source characterization
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High-harmonic generation